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Publications

  1. Shih-Wen Liu and Chien-Wei Wu* (2024). An efficient partial sampling inspection for lot sentencing based on process yield. Annals of Operations Research, 340(1), 325-344.

  2. Chien-Wei Wu*, Armin Darmawan, and Shih-Wen Liu (2024). Developing a stage-independent multiple sampling plan with loss-based capability index for lot disposition. Journal of the Operational Research Society (Accepted). 【SCI, EI】

  3. Shih-Wen Liu, ZH Wang, TC Wang*. (2023). Developing a cost-efficient dual sampling system for lot disposition by considering process yield and quality loss. Quality Engineering, 35(2), 267-278.【SCI, EI】

  4. Shih-Wen Liu*, ZH Wang. (2023). A new Spk-based sample-size tightening sampling system for lot determination. Quality Technology & Quantitative Management, 20(5), 545-560.【SCI, EI】

  5. CW Wu, D. Armin, Shih-Wen Liu*. (2023). Stage-independent multiple sampling plan by variables inspection for lot determination based on the process capability index Cpk. International Journal of Production Research, 61(10), 3171-3183.【SCI, EI】

  6. Shih-Wen Liu, CW Wu, ZH Wang*. (2022). An integrated operating mechanism for lot sentencing based on process yield. Quality Technology & Quantitative Management. 19(2), 139-152.  【SCI, EI】

  7. CW Wu*, JT Chen, Shih-Wen Liu. (2022). Designing a yield-based skip-lot sampling plan for lot acceptance determination. Journal of the Operational Research Society. 73(3), 653-663.  【SCI, EI】

  8. CW Wu, AHI Lee*,  Shih-Wen Liu. (2022). A repetitive group sampling plan based on the lifetime performance index under gamma distribution. Quality and Reliability Engineering International. 38(4), 2049-2064.【SCI, EI】

  9. Shih-Wen Liu*, CW Wu. (2022). Yield-based variables repetitive group plan with a critical-value-adjusted mechanism. Quality and Reliability Engineering International, 38(6), 3017-3032.【SCI, EI】

  10. CW Wu, AHI Lee*, Shih-Wen Liu, CH Liu. (2021). Designing acceptance sampling plans based on the lifetime performance index under gamma distribution. The International Journal of Advanced Manufacturing Technology, 115(11), 3409-3422.【SCI, EI】

  11. Shih-Wen Liu, CW Wu*, YH Tsai. (2021). An adjustable inspection scheme for lot sentencing based on one-sided process capability indices. Applied Mathematical Modelling. 96, 766-778. 【SCI, EI】

  12. Shih-Wen Liu*, KL Chen. (2019). Constructing a two-plan sampling system based on process yield index. Journal of Innovation and Business Management, 8(2), 77-86.

  13. CW Wu*, Shih-Wen Liu, JT Chen, JJ Lin. (2019). Design and construction of a variables switch-based sampling system for product acceptance determination. The International Journal of Advanced Manufacturing Technology, 101(9-12), 2643-2652. 【SCI, EI】

  14. CW Wu*, Shih-Wen Liu. (2018). A new lot sentencing approach by variables inspection based on process yield. International Journal of Production Research, 56(12), 4087-4099. 【SCI, EI】

  15. CW Wu, AHI Lee*, Shih-Wen Liu, MH Shih. (2017). Capability-based quick switching sampling system for lot disposition. Applied Mathematical Modelling, 52, 131-144. 【SCI, EI】

  16. CW Wu, MH Shu*, Shih‐Wen Liu. (2017). A Situationally Sample‐Size‐Adjusted Sampling Scheme Based on Process Yield Verification. Quality and Reliability Engineering International, 33(1), 57-69. 【SCI, EI】

  17. Shih-Wen Liu, CW Wu*. (2016). A quick switching sampling system by variables for controlling lot fraction nonconforming. International Journal of Production Research, 54 (6), 1839-1849. 【SCI, EI】

  18. CW Wu, Shih-Wen Liu, AHI Lee*. (2015). Design and construction of a variables multiple dependent state sampling plan based on process yield. European Journal of Industrial Engineering, 9(6), 819-838. 【SCI, EI】

  19. Shih-Wen Liu, CW Wu*. (2014). Design and construction of a variables repetitive group sampling plan for unilateral specification limit. Communications in Statistics-Simulation and Computation, 43(8).1866-1878. 【SCI, EI】

  20. Shih-Wen Liu, SW Lin, CW Wu*. (2014). A resubmitted sampling scheme by variables inspection for controlling lot fraction nonconforming. International Journal of Production Research, 52(12), 3744-3754. 【SCI, EI】

  21. CW Wu*, Shih-Wen Liu. (2014). Developing a sampling plan by variables inspection for controlling lot fraction of defectives. Applied Mathematical Modelling, 38 (9-10), 2303-2310. 【SCI, EI】

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